# klarf **Repository Path**: gun_s/klarf ## Basic Information - **Project Name**: klarf - **Description**: No description available - **Primary Language**: Unknown - **License**: MIT - **Default Branch**: main - **Homepage**: None - **GVP Project**: No ## Statistics - **Stars**: 0 - **Forks**: 1 - **Created**: 2025-01-09 - **Last Updated**: 2025-01-09 ## Categories & Tags **Categories**: Uncategorized **Tags**: None ## README

drawing

#### Dealing with particles is hard. klarfkit makes it easier. [![Actively Maintained](https://img.shields.io/badge/Maintenance%20Level-Actively%20Maintained-brightgreen.svg)](https://gist.github.com/cheerfulstoic/d107229326a01ff0f333a1d3476e068d) ![Build Status](https://img.shields.io/badge/build-passing-brightgreen.svg) ## Introduction klarfkit can be used to analyze semiconductor wafer maps to locate issues with production or failing parts: Simply load a klarf file, typically with the extension `.001` into the WaferMap and generate plots from that klarf ### Applications - Generate a plot to locate defects caused by process variation - Overlay several KLARF defect files into one wafer map to find hidden process issues - Color defects on the defect map by time, process, defect class, size, inspector, or any number of KLARF attributes - Edit KLARF files by exporting the raw data to CSV or Excel formats and importing the data back into KLARF format - Combine several KLARF files together ## Installation ```bash pip install git+https://github.com/MichaelHotaling/klarfkit.git ``` ## Contributing If you have different file versions, please consider adding them to the `sample_files` folder via *Pull Request*. Any additional files are very welcome and help to ensure the library works for all KLARF versions. ## Documentation and tutorials [Official documentation](http://klarfkit.readthedocs.io/en/latest/) ## Questions? Comments? Requests? Please create an issue in the [klarfkit repository](https://github.com/MichaelHotaling/klarfkit/issues).