# klarf
**Repository Path**: gun_s/klarf
## Basic Information
- **Project Name**: klarf
- **Description**: No description available
- **Primary Language**: Unknown
- **License**: MIT
- **Default Branch**: main
- **Homepage**: None
- **GVP Project**: No
## Statistics
- **Stars**: 0
- **Forks**: 1
- **Created**: 2025-01-09
- **Last Updated**: 2025-01-09
## Categories & Tags
**Categories**: Uncategorized
**Tags**: None
## README
#### Dealing with particles is hard. klarfkit makes it easier.
[](https://gist.github.com/cheerfulstoic/d107229326a01ff0f333a1d3476e068d)

## Introduction
klarfkit can be used to analyze semiconductor wafer maps to locate issues with production or failing parts:
Simply load a klarf file, typically with the extension `.001` into the WaferMap and generate plots from that klarf
### Applications
- Generate a plot to locate defects caused by process variation
- Overlay several KLARF defect files into one wafer map to find hidden process issues
- Color defects on the defect map by time, process, defect class, size, inspector, or any number of KLARF attributes
- Edit KLARF files by exporting the raw data to CSV or Excel formats and importing the data back into KLARF format
- Combine several KLARF files together
## Installation
```bash
pip install git+https://github.com/MichaelHotaling/klarfkit.git
```
## Contributing
If you have different file versions, please consider adding them to the `sample_files` folder via *Pull Request*.
Any additional files are very welcome and help to ensure the library works for all KLARF versions.
## Documentation and tutorials
[Official documentation](http://klarfkit.readthedocs.io/en/latest/)
## Questions? Comments? Requests?
Please create an issue in the [klarfkit repository](https://github.com/MichaelHotaling/klarfkit/issues).